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Reliability Wearout Mechanisms in Advanced CMOS Technologies / Alvin W. Strong, Ernest Y. Wu, Rolf-Peter Vollertsen, Jordi Sune, Giuseppe La Rosa, Timothy D. Sullivan, Stewart E. Rauch III | |
Publisher: Wiley-IEEE Press | |
Availability:Usually ships in 24 hours | |
Sales Rank: 2085571 | |
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