Semiconductor Device and Failure Analysis : Using Photon Emission Microscopy
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Book Details
Author(s)Wai Kin Chim
PublisherWiley
ISBN / ASIN047149240X
ISBN-139780471492405
AvailabilityIn stock. Usually ships within 2 to 3 days.
Sales Rank2,085,708
CategoryScience
MarketplaceUnited States 🇺🇸
Description ▲
Fault detection has become increasingly difficult as integrated circuits become more and more complex. Photon Emission Microscopy (PEM) is a physical failure analysis technique which locates and identifies faults in integrated circuits.
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