Noise in Devices And Circuits 3 (Proceedings of SPIE)

Name: Noise in Devices And Circuits 3 (Proceedings of SPIE)
Author: Alexander A. Balandin, Francois Danneville, M. Jamal Deen, Daniel M. Fleetwood
ISBN: 9780819458391

Author Alexander A. Balandin, Francois Danneville, M. Jamal Deen, Daniel M. Fleetwood

Publisher Society of Photo Optical

📄 Viewing lite version Full site ›

🌎 Shop on Amazon — choose country

🇺🇸 USA 🇨🇦 Canada 🇬🇧 UK 🇩🇪 Germany 🇫🇷 France 🇮🇳 India

80.00 USD

🛒 Buy New on Amazon 🇺🇸

✓ Usually ships in 24 hours

Book Details

Author(s)Alexander A. Balandin, Francois Danneville, M. Jamal Deen, Daniel M. Fleetwood

PublisherSociety of Photo Optical

ISBN / ASIN0819458392

ISBN-139780819458391

AvailabilityUsually ships in 24 hours

MarketplaceUnited States 🇺🇸