This book provides a comprehensive overview of stacking faults in crystal structures: Notations used in representations of close-packed structures; types of faults; methods of detection and measurement: X-ray diffraction, electron diffraction and other techniques; theoretical models of non-random faulting during phase transitions and specific examples of close packed structures including zinc sulphide, silicon carbide and silver iodide
Random Non-Random Periodic Fau
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Book Details
Author(s)M. T. Sebastian, P. Krishna
PublisherRoutledge
ISBN / ASIN2881249256
ISBN-139782881249259
AvailabilityUsually ships in 24 hours
Sales Rank6,243,364
MarketplaceUnited States 🇺🇸