Gate Dielectrics and MOS ULSIs: Principles, Technologies and Applications (Springer Series in Electronics and Photonics)
📄 Viewing lite version
Full site ›
⌛ 🇫🇷 France pricing being fetched…
Prices will appear once fetched — usually within a few minutes.
View in:
🇺🇸 USA
Book Details
Author(s)Takashi Hori
PublisherSpringer
ISBN / ASIN3540631828
ISBN-139783540631828
CategoryTechnology & Engineering
MarketplaceFrance 🇫🇷
Description ▲
Gate Dielectrics focusses on dielectric films satisfying the superior quality gate dielectric even in large-scale integration. The information presented is rather up to date with regard to nanometer-range ultrathin gate-dielectric films, which are indispensible for submicrometer ULSIs.
More Books in Technology & Engineering
Fourth Dimension in Building: Strategies for Avoiding …
View
Design and Evaluation of Rigid and Flexible Pavements,…
View
Nuclear Nonproliferation: Status Of U.s. Efforts To Im…
View
Time-Domain Numerical Methods for Modelling Antennas, …
View
The Rise of the Standard Model: A History of Particle …
View
Synthesis, Properties and Crystal Chemistry of Perovsk…
View
Error Propagation in Environmental Modelling with GIS …
View
Crops And Environmental Change: An Introduction To Eff…
View
Multicarrier Modulation with Low PAR: Applications to …
View