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Can we still pick out the bad apples? (polygraph examination) (column): An article from: Security Management

Author Michael H. Capps
Publisher American Society for Industrial Security
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Book Details
ISBN / ASINB0008SDWB8
ISBN-13978B0008SDWB8
AvailabilityAvailable for download now
Sales Rank13,207,142
MarketplaceUnited States 🇺🇸

Description

This digital document is an article from Security Management, published by American Society for Industrial Security on June 1, 1989. The length of the article is 1261 words. The page length shown above is based on a typical 300-word page. The article is delivered in HTML format and is available in your Amazon.com Digital Locker immediately after purchase. You can view it with any web browser.

Citation Details
Title: Can we still pick out the bad apples? (polygraph examination) (column)
Author: Michael H. Capps
Publication:Security Management (Refereed)
Date: June 1, 1989
Publisher: American Society for Industrial Security
Volume: v33 Issue: n6 Page: p128(2)

Article Type: column

Distributed by Thomson Gale