Analytical techniques for characterization of organic molecular assemblies in molecular electronics devices [An article from: Analytica Chimica Acta]

This digital document is a journal article from Analytica Chimica Acta, published by Elsevier in 2006. The article is delivered in HTML format and is available in your Amazon.com Media Library immediately after purchase. You can view it with any web browser.

Description:
The analytical techniques used for the physical characterization of organic molecular electronic-based devices are surveyed and discussed. These protocols include methods that are used to probe molecular assemblies such as single wavelength ellipsometry, water contact angle goniometry, cyclic voltammetry, infrared spectroscopy, and X-ray photoelectron spectroscopy, and methods used to measure charge transport properties of devices such as scanning tunneling microscopy, and inelastic electron tunneling spectroscopy. Examples from our laboratory and the literature are given for each of these analytical techniques.