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IEC 60931-2 Ed. 2.0 b:1995, Shunt power capacitors of the non-self-healing type for a.c. systems having a rated voltage up to and including 1000 V - Part 2: Ageing test and destruction test

Author IEC TC/SC 33
Publisher Multiple. Distributed through American National Standards Institute (ANSI)
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Book Details
Author(s)IEC TC/SC 33
ISBN / ASINB000Y2LP4O
ISBN-13978B000Y2LP48
AvailabilityUsually ships in 24 hours
Sales Rank99,999,999
MarketplaceUnited States 🇺🇸

Description

Applies to capacitors according to IEC 60931-1 and gives the requirements for the ageing test and destruction test for these capacitors. The two ageing test methods are intended to ensure that the capacitor case temperature is maintained constant during the test. The destruction test is performed to evaluate the behaviour of the capacitor at the end of its life. This title may contain less than 24 pages of technical content.