Assessing a Strategy's Fit with a Pattern: Pattern-Based Analysis of Disruptive Ideas

Name: Assessing a Strategy's Fit with a Pattern: Pattern-Based Analysis of Disruptive Ideas
Author: Scott D. Anthony, Mark W. Johnson, Joseph V. Sinfield, Elizabeth J. Altman
ISBN: 978B001GLLPV1

Author Scott D. Anthony, Mark W. Johnson, Joseph V. Sinfield, Elizabeth J. Altman

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Book Details

Author(s)Scott D. Anthony, Mark W. Johnson, Joseph V. Sinfield, Elizabeth J. Altman

ISBN / ASINB001GLLPV0

ISBN-13978B001GLLPV1

MarketplaceUnited States 🇺🇸