Materials Science in Microelectronics I, Second Edition: The Relationships Between Thin Film Processing & Structure Buy on Amazon
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Materials Science in Microelectronics I, Second Edition: The Relationships Between Thin Film Processing & Structure

Publisher Elsevier Science
255.00 USD

Usually ships in 24 hours

Book Details
Author(s) Eugene Machlin
Publisher Elsevier Science
ISBN / ASIN 008044640X
ISBN-13 9780080446400
Availability Usually ships in 24 hours
Sales Rank #3,634,614
Marketplace United States 🇺🇸
Description
Thin films play a key role in the material science of microelectronics, and the subject matter of thin-films divides naturally into two headings: processing / structure relationship, and structure / properties relationship.

The first volume of Materials Science in Microelectronics focuses on the first relationship - that between processing and the structure of the thin-film. The state of the thin film’s surface during the period that one monolayer exists - before being buried in the next layer - determines the ultimate structure of the thin film, and thus its properties. This volume takes into consideration the following potential influencing factors: crystal defects, void structure, grain structure, interface structure in epitaxial films, the structure of amorphous films, and reaction-induced structure.

An ideal text or reference work for students and researchers in material science, who need to learn the basics of thin films.
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