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Trap Level Spectroscopy in Amorphous Semiconductors (Elsevier Insights)

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Book Details

PublisherElsevier
ISBN / ASIN012384715X
ISBN-139780123847157
AvailabilityUsually ships in 24 hours
Sales Rank9,064,914
MarketplaceUnited States  🇺🇸

Description

Although amorphous semiconductors have been studied for over four decades, many of their properties are not fully understood. This book discusses not only the most common spectroscopic techniques but also describes their advantages and disadvantages.
  • Provides information on the most used spectroscopic techniques
  • Discusses the advantages and disadvantages of each technique
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