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Design-For-Test for Digital Ic's & Embedded Core Systems Buy Now 🇺🇸 Buy Now $37.37 USD www.amazon.com

Design-For-Test for Digital Ic's & Embedded Core Systems

Author Alfred L. Crouch
Publisher Prentice Hall
Category Computers
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Book Details
Author(s) Alfred L. Crouch
Publisher Prentice Hall
ISBN / ASIN 0130848271
ISBN-13 9780130848277
Sales Rank #2,694,981
Category Computers
Marketplace United States
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Description
Provides testing strategies that address business needs for quality, reliability, and cost control. This book helps to optimize the engineering trade-offs between resources such as silicon area, operating frequency, and power consumption. Focusing on automatic test pattern generation (ATPG), it is for the engineers involved in design and testing.
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