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Monte Carlo Modeling for Electron Microscopy and Microanalysis (Oxford Series on Optical and Imaging Sciences)

Name: Monte Carlo Modeling for Electron Microscopy and Microanalysis (Oxford Series on Optical and Imaging Sciences)
Author: David C. Joy
ISBN: 9780195088748

AuthorDavid C. Joy

PublisherOxford University Press

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Book Details

Author(s)David C. Joy

PublisherOxford University Press

ISBN / ASIN0195088743

ISBN-139780195088748

MarketplaceUnited States 🇺🇸