Rapid Reliability Assessment of VLSICs
Book Details
Author(s)
Dorey, A.P.
Publisher
Springer
ISBN / ASIN
030643492X
ISBN-13
9780306434921
Availability
Only 1 left in stock - order soon.
Category
Computers
Marketplace
United States 🇺🇸
Description
Describes methods of assessing the quality and reliability of VLSICs (very large scale integrated circuits) using sensitive, non-destructive, electrical measurements. A selection of tests has been devised and evaluated on relatively small scale integrated digital circuits made with CMOS technology.
