Backscattered Scanning Electron Microscopy and Image Analysis of Sediments and Sedimentary Rocks Buy on Amazon

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Backscattered Scanning Electron Microscopy and Image Analysis of Sediments and Sedimentary Rocks

Book Details

ISBN / ASIN0521453461
ISBN-139780521453462
MarketplaceUnited States  🇺🇸

More Books by David H. Krinsley, Kenneth Pye, Sam Boggs Jr, N. Keith Tovey

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