Scanning Tunneling Microscopy/Spectroscopy and Related Techniques: 12th International Conference, STM'03 (AIP Conference Proceedings)

At this conference the latest developments in the design, construction, and application of scanning probe microscopy like Scanning Tunneling Microscopy (STM), Atomic Force Microscopy (AFM), Magnetic Force Microscopy (MFM), Scanning Near-Field Optical Microscopy (SNOM) in the fields of nanotechnology, physics, chemistry, and biology were discussed.