Scanning Tunneling Microscopy/Spectroscopy and Related Techniques: 12th International Conference, STM'03 (AIP Conference Proceedings)
Book Details
Author(s)
American Institute of Physics
Publisher
American Institute of Physics
ISBN / ASIN
0735401683
ISBN-13
9780735401686
Availability
Usually ships in 24 hours
Sales Rank
#13,770,530
Category
Science
Marketplace
United States 🇺🇸
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Description
At this conference the latest developments in the design, construction, and application of scanning probe microscopy like Scanning Tunneling Microscopy (STM), Atomic Force Microscopy (AFM), Magnetic Force Microscopy (MFM), Scanning Near-Field Optical Microscopy (SNOM) in the fields of nanotechnology, physics, chemistry, and biology were discussed.
