Stress-Induced Phenomena in Metallization: Ninth International Workshop on Stress-Induced Phenomena in Metallization (AIP Conference Proceedings / Materials Physics and Applications)
Book Details
Publisher
American Institute of Physics
ISBN / ASIN
0735404593
ISBN-13
9780735404595
Availability
In stock. Usually ships within 2 to 3 days.
Sales Rank
#13,815,984
Marketplace
United States 🇺🇸
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Description
The conference was on reliability related science in ULSI interconnect. Its main purpose was to discuss the stress induced phenomena in the LSI interconnect among academic researchers and industry engineers to establish academic science and to improve the reliability of ULSI chips. All papers were peer reviewed.
