X-Ray Optics and Microanalysis: Proceedings of the 20th International Congress (AIP Conference Proceedings / Atomic, Molecular, Chemical Physics)

ICXOM Series is a platform dedicated for reporting progress in fundamental and applied research in x-ray optics and micro- and nano-analysis by means of x-ray beams (with an ICXOM20 emphasis on synchrotron sources), electrons or other energetic particles, including application examples, as well as methodological and instrumental developments.