Semiconductor Memories: Technology, Testing, and Reliability Buy on Amazon
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Semiconductor Memories: Technology, Testing, and Reliability

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Book Details
Author(s) Ashok K. Sharma
Publisher Wiley-IEEE Press
ISBN / ASIN 0780310004
ISBN-13 9780780310001
Availability Usually ships in 24 hours
Sales Rank #2,356,384
Marketplace United States 🇺🇸
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Description
Semiconductor Memories provides in-depth coverage in the areas of design for testing, fault tolerance, failure modes and mechanisms, and screening and qualification methods including.
* Memory cell structures and fabrication technologies.
* Application-specific memories and architectures.
* Memory design, fault modeling and test algorithms, limitations, and trade-offs.
* Space environment, radiation hardening process and design techniques, and radiation testing.
* Memory stacks and multichip modules for gigabyte storage.
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