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Integrated Circuit Manufacturability: The Art of Process and Design Integration
Book Details
PublisherWiley-IEEE Press
ISBN / ASIN0780334477
ISBN-139780780334472
AvailabilityUsually ships in 1 to 2 months
Sales Rank5,752,433
CategoryComputers
MarketplaceUnited States 🇺🇸
Description
"INTEGRATED CIRCUIT MANUFACTURABILITY provides comprehensive coverage of the process and design variables that determine the ease and feasibility of fabrication (or manufacturability) of contemporary VLSI systems and circuits. This book progresses from semiconductor processing to electrical design to system architecture. The material provides a theoretical background as well as case studies, examining the entire design for the manufacturing path from circuit to silicon. Each chapter includes tutorial and practical applications coverage.
INTEGRATED CIRCUIT MANUFACTURABILITY illustrates the implications of manufacturability at every level of abstraction, including the effects of defects on the layout, their mapping to electrical faults, and the corresponding approaches to detect such faults. The reader will be introduced to key practical issues normally applied in industry and usually required by quality, product, and design engineering departments in today's design practices:
* Yield management strategies
* Effects of spot defects
* Inductive fault analysis and testing
* Fault-tolerant architectures and MCM testing strategies.
This book will serve design and product engineers both from academia and industry. It can also be used as a reference or textbook for introductory graduate-level courses on manufacturing."
INTEGRATED CIRCUIT MANUFACTURABILITY illustrates the implications of manufacturability at every level of abstraction, including the effects of defects on the layout, their mapping to electrical faults, and the corresponding approaches to detect such faults. The reader will be introduced to key practical issues normally applied in industry and usually required by quality, product, and design engineering departments in today's design practices:
* Yield management strategies
* Effects of spot defects
* Inductive fault analysis and testing
* Fault-tolerant architectures and MCM testing strategies.
This book will serve design and product engineers both from academia and industry. It can also be used as a reference or textbook for introductory graduate-level courses on manufacturing."









