A Probabilistic Analysis of Test Response Compaction
40.00
USD
Book Details
Author(s)
Slawomir Pilarski, Tiko Kameda
ISBN / ASIN
0818665327
ISBN-13
9780818665325
Sales Rank
#2,970,793
Category
Computers
Marketplace
United States 🇺🇸
Description
Synthesizes recent findings on the chance of missing a faulty circuit when the data from testing microelectronic systems is compacted to be more manageable, a situation known as aliasing. Considers single and multiple stuck-at, delay, and stuck-open faults. Also reviews the testing of VLSI, introduc
