Tutorial: Test Generation for Vlsi Chips
Book Details
Publisher
Ieee Computer Society
ISBN / ASIN
081868786X
ISBN-13
9780818687860
Availability
In stock. Usually ships within 2 to 3 days.
Sales Rank
#12,837,215
Marketplace
United States 🇺🇸
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Description
Reprints of papers taken from 18 different journals, published between 1967 and 1987. They give a comprehensive overview of very large-scale integration testing. No significant prior experience in testing is assumed. Concepts and current practices are emphasized. Chapters are preceded by a tutorial.
