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Advanced X-Ray/Euv Radiation Sources and Applications (Proceedings of Spie)

AuthorJames P. Knauer
PublisherSociety of Photo Optical
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Book Details

Author(s)James P. Knauer
PublisherSociety of Photo Optical
ISBN / ASIN0819404063
ISBN-139780819404060
AvailabilityUsually ships in 1 to 3 weeks
Sales Rank13,246,853
MarketplaceUnited States  🇺🇸
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