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Selected Papers on Optical Methods in Surface Metrology (SPIE Milestone Series Vol. MS129)

Name: Selected Papers on Optical Methods in Surface Metrology (SPIE Milestone Series Vol. MS129)
Author: David J. Whitehouse
ISBN: 9780819423474

AuthorDavid J. Whitehouse

PublisherSPIE Press

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Book Details

Author(s)David J. Whitehouse

PublisherSPIE Press

ISBN / ASIN0819423475

ISBN-139780819423474

AvailabilityUsually ships in 24 hours

Sales Rank12,606,742

MarketplaceUnited States 🇺🇸

Description

Topics in this volume include: comparison of interferometric contouring techniques; comparison of visibility of standard scratches; and near-grazing illumination and shadowing of rough surfaces.

Selected Papers on Optical Methods in Surface Metrology (SPIE Milestone Series Vol. MS129)

Book Details

Description

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