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Rough Surface Scattering and Contamination: 21-23 July 1999, Denver, Colorado (Proceedings of Spie--the International Society for Optical Engineering, V. 3784.)

Name: Rough Surface Scattering and Contamination: 21-23 July 1999, Denver, Colorado (Proceedings of Spie--the International Society for Optical Engineering, V. 3784.)
Author: Unknown
ISBN: 9780819432704

PublisherSociety of Photo Optical

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Book Details

PublisherSociety of Photo Optical

ISBN / ASIN0819432709

ISBN-139780819432704

AvailabilityUsually ships in 24 hours

MarketplaceUnited States 🇺🇸