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Noise And Information in Nanoelectronics, Sensors, And Standards 3 (Proceedings of SPIE)

Name: Noise And Information in Nanoelectronics, Sensors, And Standards 3 (Proceedings of SPIE)
Author: Janos A. Bergou, Janusz M. Smulko, Mark I. Dykman, Lijun Wang
ISBN: 9780819458414

AuthorJanos A. Bergou, Janusz M. Smulko, Mark I. Dykman, Lijun Wang

PublisherSociety of Photo Optical

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Book Details

Author(s)Janos A. Bergou, Janusz M. Smulko, Mark I. Dykman, Lijun Wang

PublisherSociety of Photo Optical

ISBN / ASIN0819458414

ISBN-139780819458414

Sales Rank99,999,999

MarketplaceUnited States 🇺🇸