https://www.ebooknetworking.net/books_detail-0819482978.html

Advances in Metrology for X-Ray and EUV Optics III: 1-2 August 2010, San Diego, California, United States

Name: Advances in Metrology for X-Ray and EUV Optics III: 1-2 August 2010, San Diego, California, United States
Author: Lahsen Assoufid
ISBN: 9780819482976

AuthorLahsen Assoufid

PublisherSPIE Press

Shop on Amazon — choose your country

🇺🇸 USA 🇨🇦 Canada 🇬🇧 UK 🇩🇪 Germany 🇫🇷 France 🇮🇳 India

Buy New on Amazon 🇺🇸 Buy Used — $206.01

Book Details

Author(s)Lahsen Assoufid

PublisherSPIE Press

ISBN / ASIN0819482978

ISBN-139780819482976

Sales Rank99,999,999

MarketplaceUnited States 🇺🇸