Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits: The System on Chip Approach (Circuits, Devices and Systems) Buy on Amazon
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Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits: The System on Chip Approach (Circuits, Devices and Systems)

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Book Details
ISBN / ASIN 0863417450
ISBN-13 9780863417450
Availability Usually ships in 2-3 business days
Sales Rank #7,232,544
Marketplace United States 🇺🇸
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Description
This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. As well as fundamental concepts and techniques, the book reports systematically the state of the arts and future research directions of those areas. A complete range of circuit components are covered and test issues from the SoC perspective. An essential reference for researchers and engineers in mixed signal testing, postgraduate and senior undergraduate students.
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