ISTFA 2007: Proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery [With CDROM] Buy on Amazon
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ISTFA 2007: Proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery [With CDROM]

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Book Details
Author(s) ASM International
Publisher ASM International
ISBN / ASIN 0871708639
ISBN-13 9780871708632
Availability Usually ships in 24 hours
Sales Rank #12,746,711
Marketplace United States 🇺🇸
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