https://www.ebooknetworking.net/books_detail-1461375614.html

Delay Fault Testing for VLSI Circuits (Frontiers in Electronic Testing)

Name: Delay Fault Testing for VLSI Circuits (Frontiers in Electronic Testing)
Author: Angela Krstic, Kwang-Ting (Tim) Cheng
ISBN: 9781461375616

AuthorAngela Krstic, Kwang-Ting (Tim) Cheng

PublisherSpringer

Shop on Amazon — choose your country

🇺🇸 USA 🇨🇦 Canada 🇬🇧 UK 🇩🇪 Germany 🇫🇷 France 🇮🇳 India

179.00 USD

Buy New on Amazon 🇺🇸

Book Details

Author(s)Angela Krstic, Kwang-Ting (Tim) Cheng

PublisherSpringer

ISBN / ASIN1461375614

ISBN-139781461375616

MarketplaceUnited States 🇺🇸

Delay Fault Testing for VLSI Circuits (Frontiers in Electronic Testing)

Book Details

More Books by Angela Krstic, Kwang-Ting (Tim) Cheng