Advanced Scanning Electron Microscopy and X-Ray Microanalysis

Name: Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Author: Patrick Echlin, C.E. Fiori, Joseph Goldstein, David C. Joy, Dale E. Newbury
ISBN: 9781475790290

Author Patrick Echlin, C.E. Fiori, Joseph Goldstein, David C. Joy, Dale E. Newbury

Publisher Springer

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Book Details

Author(s) Patrick Echlin, C.E. Fiori, Joseph Goldstein, David C. Joy, Dale E. Newbury

Publisher Springer

ISBN / ASIN 1475790295

ISBN-13 9781475790290

Marketplace United States 🇺🇸

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Advanced Scanning Electron Microscopy and X-Ray Microanalysis

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