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Advanced Scanning Electron Microscopy and X-Ray Microanalysis

Name: Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Author: Patrick Echlin, C.E. Fiori, Joseph Goldstein, David C. Joy, Dale E. Newbury
ISBN: 9781475790290

AuthorPatrick Echlin, C.E. Fiori, Joseph Goldstein, David C. Joy, Dale E. Newbury

PublisherSpringer

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Book Details

Author(s)Patrick Echlin, C.E. Fiori, Joseph Goldstein, David C. Joy, Dale E. Newbury

PublisherSpringer

ISBN / ASIN1475790295

ISBN-139781475790290

MarketplaceUnited States 🇺🇸

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