ISTFA 2015 Proceedings from the 41st International Symposium for Testing and Failure Analysis
Book Details
Author(s)ASM International
PublisherBrand: ASM International
ISBN / ASIN162708102X
ISBN-139781627081023
MarketplaceFrance 🇫🇷
Description
This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers address the symposium's theme, Follow the Data!
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