Total Current Spectroscopy Sur

Integral secondary electron spectroscopy is a significant tool in the nondestsructuve study of surface phenomena in solids. One of themajor advances in this field during recent decades has been the evolution of total current spectroscopy (TCS), which is based on electron-surface interaction. In this detailed and comprehensive work, Professor Komlov examines this versatile method. He begins by outlining the fundamental concepts of solid surface electron yield spectroscopy. He then discusses the design of equipment used to measure total current spectra and analyses the results of studies of surface electronic structure and its changes under various vacuum treatments.