Characterisation of Thin Films and Coatings

Characterisation of Thin Films and Coatings
This session is devoted to thin film processing, growth and characterization. Topics of interest include fundamental and applied studies concerning the nucleation and microstructural evolution of thin films. Characterization methods include modern tools for surface analysis (e.g. XPS/PEEM- and AES/SIMS-depth profiling, scanning probe microscopy), X-ray and ion scattering techniques and electron microscopy. Nondestructive and in situ characterization of films is also highlighted. Especially, papers are welcome that relate deposition processes to the microstructural evolution of thin films and their optical, electrical and mechanical properties. Contributions in the following areas are sought:

• Basic processes of surface and interface formation
• Novel techniques for tailoring thin film microstructure
• Interrelations of deposition processes, microstructural evolution and properties
• Modelling of growth processes and evolving properties
• Modern techniques for thin film characterization and control of film growth