Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications (Springer Series in Materials Science)

Name: Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications (Springer Series in Materials Science)
Author: Stefan Rein
ISBN: 9783540253037

Author Stefan Rein

Publisher Springer

Shop on Amazon — pick your country

🇺🇸 USA 🇨🇦 Canada 🇬🇧 UK 🇩🇪 Germany 🇫🇷 France 🇮🇳 India

319.00 USD

Buy New on Amazon 🇺🇸

Book Details

Author(s) Stefan Rein

Publisher Springer

ISBN / ASIN 3540253033

ISBN-13 9783540253037

Marketplace United States 🇺🇸

Ratings & Reviews No reviews yet — be the first!

No reviews yet.