Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials (Springer Series in Advanced Microelectronics)
Out of Print--Limited Availability.
Book Details
Author(s)
Breitenstein, Otwin
Publisher
Springer
ISBN / ASIN
3642264786
ISBN-13
9783642264788
Availability
Out of Print--Limited Availability.
Category
Paperback
Marketplace
United States 🇺🇸
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Description
Lock-in Thermography focuses on this sensitive infrared measurement system that offers a more effective analytical capability. Though mainly covering applications in electronic materials and devices, readers will also find treatment of nondestructive evaluation.
