Theoretical Concepts of X-Ray Nanoscale Analysis: Theory and Applications (Springer Series in Materials Science)

Name: Theoretical Concepts of X-Ray Nanoscale Analysis: Theory and Applications (Springer Series in Materials Science)
Author: Andrei Benediktovich, Ilya Feranchuk, Alexander Ulyanenkov
ISBN: 9783662520543

Author Andrei Benediktovich, Ilya Feranchuk, Alexander Ulyanenkov

Publisher Springer

Category Science

Shop on Amazon — pick your country

🇺🇸 USA 🇨🇦 Canada 🇬🇧 UK 🇩🇪 Germany 🇫🇷 France 🇮🇳 India

158.40 179.00 -12% USD

Buy New on Amazon 🇺🇸 Used — $159.59

Usually ships in 1-2 business days

Book Details

Author(s) Andrei Benediktovich, Ilya Feranchuk, Alexander Ulyanenkov

Publisher Springer

ISBN / ASIN 3662520540

ISBN-13 9783662520543

Availability Usually ships in 1-2 business days

Sales Rank #99,999,999

Category Science

Marketplace United States 🇺🇸

Ratings & Reviews No reviews yet — be the first!

No reviews yet.

Description

This book surveys concepts of X-ray materials analysis, including X-ray scattering and interaction between X-rays and matter, plus techniques including high-resolution X-ray diffraction, reflectivity, grazing-incidence small-angle X-ray scattering and more.

Theoretical Concepts of X-Ray Nanoscale Analysis: Theory and Applications (Springer Series in Materials Science)

More Books in Science