Defects and Diffusion in Metals: An Annual Retrospective (Defect and Diffusion Forum) Buy on Amazon

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Defects and Diffusion in Metals: An Annual Retrospective (Defect and Diffusion Forum)

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ISBN / ASIN3908450845
ISBN-139783908450849
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Sales Rank13,134,754
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This sixth volume in the series covering the latest results in the field includes abstracts of papers which appeared between the publication of Annual Retrospective V (Volumes 213-215) and the end of October 2003. As well as the abstracts, the issue includes original papers on the topics of "Free surface relaxation and two-beam TEM imaging of straight dislocations in thin foils" (R.Bonnet et al), "Free volume diffusion and optimization of soft magnetic properties in amorphous alloys based upon iron" (G.Haneczok and J.Rasek), "Super-high concentrations of vacancies in regions of high concentration of point defects and composition of vacancy-oxygen complexes in these regions in Pd, Ta, W and Pt Polycrystals" (S.M.Klotsman et al), "Atomic, electron and phonon aspects of the edge dislocation in iron" (H.B.Liu and J.A.Ascencio), "Calculation of tracer and chemical diffusion coefficients in [beta]-AgMg" (I.V.Belova and G.E.Murch), "Investigation of hydride formation in crystalline and amorphous metallic alloys using electrochemical hydrogen permeation tests" (D.S. dos Santos), a computational study of "Vacancy-formation thermodynamics in aluminum and nickel" (S.Ramos de Debiaggi et al), "Hydrogen diffusion in Laves-phase compounds" (A. V.Skripov), nuclear magnetic resonance aspects of "Chemical and intrinsic hydrogen diffusion in Pd-Ag-H alloys" (M.Bokor et al), "A discrete dislocation plasticity model of creep in polycrystalline thin films" (A.Hartmaier et al) and a "Simple iterative method for analyzing experimental tracer diffusivities in concentrated binary alloys" (I.V.Belova and G.E.Murch). Altogether, these 11 invited papers and 550 selected abstracts provide an up-to-date insight into current and future trends in metals theory, processing and applications as related to diffusional phenomena and defect behavior.

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