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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test (Frontiers in Electronic Testing)

Name: CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test (Frontiers in Electronic Testing)
Author: Andrei Pavlov, Manoj Sachdev
ISBN: 9789048178551

AuthorAndrei Pavlov, Manoj Sachdev

PublisherSpringer

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Book Details

Author(s)Andrei Pavlov, Manoj Sachdev

PublisherSpringer

ISBN / ASIN904817855X

ISBN-139789048178551

MarketplaceUnited States 🇺🇸

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test (Frontiers in Electronic Testing)

Book Details

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