https://www.ebooknetworking.net/books_detail-B00071UHAA.html

RYE: A realistic yield simulator for VLSIC structural failures (Research report / SRC-CMU Research Center for Computer-Aided Design, Dept. of Electrical and Computer Engineering)

Name: RYE: A realistic yield simulator for VLSIC structural failures (Research report / SRC-CMU Research Center for Computer-Aided Design, Dept. of Electrical and Computer Engineering)
Author: Ihao Chen
ISBN: 978B00071UHA0

AuthorIhao Chen

PublisherSRC-CMU Research Center for Computer-Aided Design, Dept. of Electrical and Computer Engineering, Car

Shop on Amazon — choose your country

🇺🇸 USA 🇨🇦 Canada 🇬🇧 UK 🇩🇪 Germany 🇫🇷 France 🇮🇳 India

Buy New on Amazon 🇺🇸

Book Details

Author(s)Ihao Chen

PublisherSRC-CMU Research Center for Computer-Aided Design, Dept. of Electrical and Computer Engineering, Car

ISBN / ASINB00071UHAA

ISBN-13978B00071UHA0

Sales Rank99,999,999

MarketplaceUnited States 🇺🇸

RYE: A realistic yield simulator for VLSIC structural failures (Research report / SRC-CMU Research Center for Computer-Aided Design, Dept. of Electrical and Computer Engineering)

Book Details

More Books by Ihao Chen