Pb-free's impacts on test and inspection: early runs show higher numbers of opens, bridges and voids.(Test and Inspection): An article from: Circuits Assembly

This digital document is an article from Circuits Assembly, published by UP Media Group, Inc. on January 1, 2005. The length of the article is 659 words. The page length shown above is based on a typical 300-word page. The article is delivered in HTML format and is available in your Amazon.com Digital Locker immediately after purchase. You can view it with any web browser.

Citation Details
Title: Pb-free's impacts on test and inspection: early runs show higher numbers of opens, bridges and voids.(Test and Inspection)
Author: Stig Oresjo
Publication:Circuits Assembly (Magazine/Journal)
Date: January 1, 2005
Publisher: UP Media Group, Inc.
Volume: 16 Issue: 1 Page: 50(1)

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