Application of x-ray spectroscopic scattering topography to rubber based composites.: An article from: Rubber World

This digital document is an article from Rubber World, published by Lippincott & Peto, Inc. on January 1, 1997. The length of the article is 1224 words. The page length shown above is based on a typical 300-word page. The article is delivered in HTML format and is available in your Amazon.com Digital Locker immediately after purchase. You can view it with any web browser.

From the supplier: X-ray spectroscopic scattering topography is being used to reveal the inner structure and possible irregularities of rubber and rubber products to a far greater degree than that shown by ordinary x-ray absorption radiography. Use of x-ray spectroscopic scattering topography can disclose organic fiber cords embedded in unvulcanized rubber sheet, different fiber cords and rubber compounds in tires, and rubber vulcanizate's anomalous structure.

Citation Details
Title: Application of x-ray spectroscopic scattering topography to rubber based composites.
Author: Y. Udagawa
Publication:Rubber World (Magazine/Journal)
Date: January 1, 1997
Publisher: Lippincott & Peto, Inc.
Volume: v215 Issue: n4 Page: p31(3)

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