A change-point analysis for modeling incomplete burn-in for light displays.: An article from: IIE Transactions
Book Details
Author(s)Suk Joo Bae, Paul H. Kvam
PublisherThomson Gale
ISBN / ASINB000GAL6RA
ISBN-13978B000GAL6R6
AvailabilityAvailable for download now
MarketplaceUnited States 🇺🇸
Description
This digital document is an article from IIE Transactions, published by Thomson Gale on June 1, 2006. The length of the article is 7787 words. The page length shown above is based on a typical 300-word page. The article is delivered in HTML format and is available in your Amazon.com Digital Locker immediately after purchase. You can view it with any web browser.
From the author: In testing display devices such as Plasma Display Panels (PDPs), the observed degradation in luminosity can exhibit an unstable period due to incomplete burn-in during the manufacturing process. We introduce a log-linear model with random coefficients and a change point to describe the nonlinear degradation path. The change point represents the time at which the burn-in period has finished and the degradation in the luminosity changes to a slower and more stable rate. The inference procedure for the lifetime distribution is based on maximum likelihood estimators and results indicate that reliability estimation can be improved substantially by using the change-point model to account for product burn-in effects. An example based on laboratory tests of PDPs helps to illustrate the procedure.
Citation Details
Title: A change-point analysis for modeling incomplete burn-in for light displays.
Author: Suk Joo Bae
Publication:IIE Transactions (Magazine/Journal)
Date: June 1, 2006
Publisher: Thomson Gale
Volume: 38 Issue: 6 Page: 489(10)
Distributed by Thomson Gale
From the author: In testing display devices such as Plasma Display Panels (PDPs), the observed degradation in luminosity can exhibit an unstable period due to incomplete burn-in during the manufacturing process. We introduce a log-linear model with random coefficients and a change point to describe the nonlinear degradation path. The change point represents the time at which the burn-in period has finished and the degradation in the luminosity changes to a slower and more stable rate. The inference procedure for the lifetime distribution is based on maximum likelihood estimators and results indicate that reliability estimation can be improved substantially by using the change-point model to account for product burn-in effects. An example based on laboratory tests of PDPs helps to illustrate the procedure.
Citation Details
Title: A change-point analysis for modeling incomplete burn-in for light displays.
Author: Suk Joo Bae
Publication:IIE Transactions (Magazine/Journal)
Date: June 1, 2006
Publisher: Thomson Gale
Volume: 38 Issue: 6 Page: 489(10)
Distributed by Thomson Gale
