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Scanning Electron Microscopy and X-ray Microanalysis: Third Edition

Name: Scanning Electron Microscopy and X-ray Microanalysis: Third Edition
Author: Joseph Goldstein, Dale E. Newbury, David C. Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda Sawyer, J.R. Michael
ISBN: 978B000VQEY57

AuthorJoseph Goldstein, Dale E. Newbury, David C. Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda Sawyer, J.R. Michael

PublisherSpringer

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Book Details

Author(s)Joseph Goldstein, Dale E. Newbury, David C. Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda Sawyer, J.R. Michael

PublisherSpringer

ISBN / ASINB000VQEY5K

ISBN-13978B000VQEY57

MarketplaceUnited States 🇺🇸

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