Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard (Frontiers in Electronic Testing) Buy on Amazon
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Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard (Frontiers in Electronic Testing)

Author Nicola Nicolici, Bashir M. Al-Hashimi
Publisher Springer
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Book Details
Author(s) Nicola Nicolici, Bashir M. Al-Hashimi
Publisher Springer
ISBN / ASIN B000WEFNN8
ISBN-13 978B000WEFNN2
Marketplace United States 🇺🇸
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Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard (Frontiers in Electronic Testing)
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