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IEC 61649 Ed. 1.0 b:1997, Goodness-of-fit tests, confidence intervals and lower confidence limits for Weibull distributed data Buy on Amazon

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IEC 61649 Ed. 1.0 b:1997, Goodness-of-fit tests, confidence intervals and lower confidence limits for Weibull distributed data

AuthorIEC TC/SC 56
PublisherMultiple. Distributed through American National Standards Institute (ANSI)
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Book Details

Author(s)IEC TC/SC 56
PublisherMultiple. Distributed through American National Standards Institute (ANSI)
ISBN / ASINB000XYS9HY
ISBN-13978B000XYS9H3
MarketplaceUnited States  🇺🇸

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