Home › Books › ISO/TTA 4:2002, Measurement of thermal conductivity of thin…
ISO/TTA 4:2002, Measurement of thermal conductivity of thin films on silicon substrates Buy on Amazon

https://www.ebooknetworking.net/books_detail-B000Y2U10I.html

ISO/TTA 4:2002, Measurement of thermal conductivity of thin films on silicon substrates

AuthorVAMAS/VAMAS
PublisherMultiple. Distributed through American National Standards Institute (ANSI)
Shop on Amazon — choose your country
🇺🇸 USA 🇨🇦 Canada 🇬🇧 UK 🇩🇪 Germany 🇫🇷 France 🇮🇳 India
163.90 USD
Buy New on Amazon 🇺🇸

Book Details

Author(s)VAMAS/VAMAS
PublisherMultiple. Distributed through American National Standards Institute (ANSI)
ISBN / ASINB000Y2U10I
ISBN-13978B000Y2U109
MarketplaceUnited States  🇺🇸

More Books by VAMAS/VAMAS

ISO/TTA 3:2001, Polycrystalline materials - Determination of residual stresses by neutron diffraction
ISO/TTA 3:2001, Polycrystalline materials - Determinat…
View
ISO/TTA 2:1997, Tensile tests for discontinuously reinforced metal matrix composites at ambiant temperatures
ISO/TTA 2:1997, Tensile tests for discontinuously rein…
View
Donate to EbookNetworking
Prev
Next