ISO/TTA 4:2002, Measurement of thermal conductivity of thin films on silicon substrates Buy on Amazon
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ISO/TTA 4:2002, Measurement of thermal conductivity of thin films on silicon substrates

Author VAMAS/VAMAS
Publisher Multiple. Distributed through American National Standards Institute (ANSI)
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Book Details
Author(s) VAMAS/VAMAS
Publisher Multiple. Distributed through American National Standards Institute (ANSI)
ISBN / ASIN B000Y2U10I
ISBN-13 978B000Y2U109
Marketplace United States 🇺🇸
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