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Detecting outliers in complex profiles using a [[chi].sup.2] control chart method.(Report): An article from: IIE Transactions
Book Details
Author(s)
Hang Zhang, Susan Albin
ISBN / ASIN
B0024VDRMG
ISBN-13
978B0024VDRM8
Availability
Available for download now
Marketplace
United States 🇺🇸
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Description
This digital document is an article from IIE Transactions, published by Institute of Industrial Engineers, Inc. (IIE) on April 1, 2009. The length of the article is 9176 words. The page length shown above is based on a typical 300-word page. The article is delivered in HTML format and is available immediately after purchase. You can view it with any web browser.
Citation Details
Title: Detecting outliers in complex profiles using a [[chi].sup.2] control chart method.(Report)
Author: Hang Zhang
Publication:IIE Transactions (Magazine/Journal)
Date: April 1, 2009
Publisher: Institute of Industrial Engineers, Inc. (IIE)
Volume: 41 Issue: 4 Page: 335(11)
Article Type: Report
Distributed by Gale, a part of Cengage Learning
Citation Details
Title: Detecting outliers in complex profiles using a [[chi].sup.2] control chart method.(Report)
Author: Hang Zhang
Publication:IIE Transactions (Magazine/Journal)
Date: April 1, 2009
Publisher: Institute of Industrial Engineers, Inc. (IIE)
Volume: 41 Issue: 4 Page: 335(11)
Article Type: Report
Distributed by Gale, a part of Cengage Learning
