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X-ray emission spectrographic analysis of high-purity rare-earth oxides

AuthorFarrel W. Lytle
PublisherUniversity of Michigan Library
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Book Details

Author(s)Farrel W. Lytle
PublisherUniversity of Michigan Library
ISBN / ASINB0041KJE3O
ISBN-13978B0041KJE36
AvailabilityUsually ships in 24 hours
MarketplaceUnited States  🇺🇸

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