{"version":"1.0","type":"rich","provider_name":"EbookNetworking","provider_url":"https://www.ebooknetworking.net","title":"Reliability of RoHS-Compliant 2D and 3D IC Interconnects (Electronic Engineering)","author_name":"John Lau","thumbnail_url":"https://www.ebooknetworking.net/books/007/175/big0071753796.jpg","thumbnail_width":330,"thumbnail_height":500,"html":"<a href=\"https://www.ebooknetworking.net/books_detail-0071753796.html\">Reliability of RoHS-Compliant 2D and 3D IC Interconnects (Electronic Engineering)</a>","width":400,"height":300}